/ Home
/ SUBMISSION

/ The BJNANO
/ Diamond Open Access
/ Journal Statistics
/ Editorial Board
/ Community
/ Call for papers

/ Latest Articles
/ Most accessed
/ Thematic issues
/ Volumes
/ Authors

/ Alerts

/ TWITTER
/ LINKEDIN
/ Mastodon
/ RSS FEED

Empty search

Article Type

Publication Date Range

Search Tips

This search combines search strings from the content search (i.e. "Full Text", "Author", "Title", "Abstract", or "Keywords") with "Article Type" and "Publication Date Range" using the AND operator.

Search Examples

aromatic	the word “aromatic”
aromatic aldehyde	the word “aromatic” OR “aldehyde”
+aromatic +aldehyde	both words “aromatic” AND “aldehyde”
+aromatic -aldehyde	the word “aromatic” but NOT “aldehyde”
“aromatic aldehyde”	the exact phrase “aromatic aldehyde”
benz*	words which begin with “benz”, such as “benzene” or “benzyl”
benz*yl	words that begin with “benz” and end with “yl”, such as “benzyl” or “benzoyl”
benzyl~	words that are close to the word “benzyl”, such as “benzoyl” (i.e., fuzzy search)

BROWSE
Latest Articles
Most accessed
thematic issues
volumes
authors

BROWSE

Latest Articles Most Accessed Thematic Issues Volumes Authors

Author

1 article(s) from Lallemand, Florent

Mapping of integrated PIN diodes with a 3D architecture by scanning microwave impedance microscopy and dynamic spectroscopy

Rosine Coq Germanicus,
Peter De Wolf,
Florent Lallemand,
Catherine Bunel,
Serge Bardy,
Hugues Murray and
Ulrike Lüders

Beilstein J. Nanotechnol. 2020, 11, 1764–1775, doi:10.3762/bjnano.11.159

PDF

Figure 1: sMIM setup showing the detection of the sMIM-C (ε) and sMIM-R (σ) signals. V_AC and V_DC are applied ...

Jump to Figure 1

Figure 2: Topography of the cross section of the PIN diode. The scanned area is 83 µm × 54 µm. Deep trenches ...

Jump to Figure 2

Figure 3: sMIM results for a 25 µm × 25 µm area at the PIN anode area (area 1 in Figure 2). (a) ∂C/∂V phase, (b) ∂C/∂V...

Jump to Figure 3

Figure 4: sMIM-C profiles along the central axis of the diode structure. A single line scan (blue) and the av...

Jump to Figure 4

Figure 5: Depth profiles (∂C/∂V phase, ∂C/∂V amplitude, sMIM-R, and sMIM-C) along the PIN structure compared ...

Jump to Figure 5

Figure 6: sMIM acquisitions of the bottom of the deep trench structure. (a) ∂C/∂V phase (10 µm × 10 µm), (b) ∂...

Jump to Figure 6

Figure 7: sMIM maps acquired at V_DC = 0 V on a large area (83 µm × 54 µm) of the PIN diode device. (a) ∂C/∂V ...

Jump to Figure 7

Figure 8: Analytic calculations of the equivalent capacitance C_Nano determined for the tip–sample contact as ...

Jump to Figure 8

Figure 9: Force curve as a function of time during the dynamic spectroscopy sMIM measurement. 1: tip approach...

Jump to Figure 9

Figure 10: sMIM-C DCUBE slices (55 µm × 33 µm) obtained for various V_DC values (the bias is applied to the sam...

Jump to Figure 10

Album

Supp Info

Full Research Paper

Published 23 Nov 2020

Full text

Other Beilstein-Institut Open Science Activities

/ Help / Support & Contact / Alerts / Privacy Policy / Terms & Conditions / Impressum